Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy.

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Summary

A new type of scanning fluorescence microscope capable of resolving 35 nm in the far field is proposed, overcome the diffraction resolution limit by employing stimulated emission to inhibit the fluorescence process in the outer regions of the excitation point-spread function.

Type
article
Published
1994-06-01
Cited by
5,394
References
6

Keywords

Optics, Microscopy, Near-field scanning optical microscope, Point spread function, Fluorescence

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