Characterization Of Single Defects In Zinc Oxide
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- 2014-05-25
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References
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- Conducting atomic force microscopy for nanoscale tunnel barrier characterization
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- Properties of Resistivity, Reflection and Absorption Related to Structure of ITO Films
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- EXPERIMENTAL QUANTUM ERROR CORRECTION
- High-precision nanoscale temperature sensing using single defects in diamond.
- Statistical evaluation of single nano-object fluorescence.
- Low-Resistivity Highly Transparent Indium-Tin-Oxide Thin Films Prepared at Room Temperature by Synchrotron Radiation Ablation
- The effect of grain boundaries on the electrical properties of zinc oxide-based varistor
- High-quality ZnO layers grown by MBE on sapphire
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