Noncontact Technique for the Local Measurement of Semiconductor Resistivity

C. A. Bryant, J. B. Gunn · Review of Scientific Instruments · 1965

Type: article
Published: 1965-11-01
Cited by: 60
References: 5
DOI: https://doi.org/10.1063/1.1719404
OpenAlex: https://openalex.org/W2027498571
Semantic Scholar: https://api.semanticscholar.org/CorpusID:122311438

Keywords

Electrical resistivity and conductivity, Materials science, Semiconductor, RADIUS, Electrical resistance and conductance

References

Low-Frequency Conductivity Due to Hopping Processes in SiliconM. Pollak, T. H. Geballe — 1961
Contactless resistivity meter for semiconductorsJ.C. Brice, P. Moore — 1961
The Measurement of Microwave Resistivity by Eddy Current Loss in Small SpheresT. Kohane — 1960
Electrodeless Measurement of Semiconductor Resistivity at Microwave FrequenciesH. Jacobs, F.A. Brand, J.D. Meindl — 1961
Radio‐Frequency Carrier and Capacitive Coupling Procedures for Resistivity and Lifetime Measurements on SiliconI. R. Weingarten, M. Rothberg — 1961

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The electrical characterisation of semiconductorsP. Blood, John Orton — 1978
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Noncontact Technique for the Local Measurement of Semiconductor Resistivity

Keywords

References

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