Contactless resistivity meter for semiconductors
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- Type
- article
- Published
- 1961-07-01
- Cited by
- 18
- References
- 0
- OpenAlex
- https://openalex.org/W1970095561
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:94225701
Keywords
Metre, Electrical resistivity and conductivity, Semiconductor, Materials science, Optoelectronics
References
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Cited by
- Microwave methods of measuring resistivity of gallium arsenide
- Neue Methoden zur Bestimmung von Leitfähigkeiten
- Measurement of High Resistivities by the Electrodeless Falling Sample Method
- Application of a scanning photon microscope to non-destructive detection of resistivity striations in a silicon wafer
- Electrodeless measurements of the effective resistivity of the human torso and head by magnetic induction.
- The electrical characterisation of semiconductors
- ELECTRODELESS MEASUREMENTS OF RESISTIVITY FLUCTUATIONS IN THE HUMAN TORSO AND HEAD *
- Noncontact Technique for the Local Measurement of Semiconductor Resistivity
- The influence of substrate properties on microwave losses in thin films of semiconductors
- Electrodeless Measurement of Resistivities over a Very Wide Range
- Use of a capacitively coupled marginal oscillator for contactless transient conductivity measurements
- Physical Principles of the Displacement Cardiograph Including a New Device Sensitive to Variations in Torso Resistivity
- Inhomogeneities in the electrical properties of gallium arsenide crystals
- Semiconductor Material and Device Characterization
- Contactless resistivity measurements: a technique adapted to graphite intercalation compounds
- Contactless measurement of semiconductor conductivity by radio frequency‐free‐carrier power absorption
- Electrical measurements on liquid selenium
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