CTFFIND4: Fast and accurate defocus estimation from electron micrographs

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Summary

Modifications to the algorithm for the estimation of objective lens defocus parameters from transmission electron micrographs are described, showing that this new version preserves the accuracy of the original algorithm while allowing for higher throughput.

Type
preprint
Published
2015-06-16
Cited by
4,872
References
16
Access
Open access

Keywords

Electron micrographs, Micrograph, Estimation, Computer vision, Computer science

References

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