CTFFIND4: Fast and accurate defocus estimation from electron micrographs
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Summary
Modifications to the algorithm for the estimation of objective lens defocus parameters from transmission electron micrographs are described, showing that this new version preserves the accuracy of the original algorithm while allowing for higher throughput.
- Type
- preprint
- Published
- 2015-06-16
- Cited by
- 4,872
- References
- 16
- Access
- Open access
- OpenAlex
- https://openalex.org/W2152153423
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:1121396
Keywords
Electron micrographs, Micrograph, Estimation, Computer vision, Computer science
References
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- Thon rings from amorphous ice and implications of beam-induced Brownian motion in single particle electron cryo-microscopy
- CTER—Rapid estimation of CTF parameters with error assessment
- Structure of β-galactosidase at 3.2-Å resolution obtained by cryo-electron microscopy
- A Primer to Single-Particle Cryo-Electron Microscopy
- Automated determination of parameters describing power spectra of micrograph images in electron microscopy.
- CTF Challenge: Result Summary
- Determination of astigmatism in TEM images.
- Accurate determination of local defocus and specimen tilt in electron microscopy.
- Volta potential phase plate for in-focus phase contrast transmission electron microscopy
- FASTDEF: fast defocus and astigmatism estimation for high-throughput transmission electron microscopy.
- ACE: automated CTF estimation.
- Single-particle electron cryo-microscopy: towards atomic resolution
- Electron energy filtering significantly improves amplitude contrast of frozen-hydrated protein at 300kV.
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- A New Protocol to Accurately Determine Microtubule Lattice Seam Location
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- Gctf: Real-time CTF determination and correction
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- A novel lipoprotein nanoparticle system for membrane proteins
- Cryo-EM single particle analysis with the Volta phase plate
- Atomic structure of Hsp90:Cdc37:Cdk4 reveals Hsp90 regulates kinase via dramatic unfolding
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