Accurate determination of local defocus and specimen tilt in electron microscopy.

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Summary

Two computer programs are presented, CTFFIND3 and CTFTILT, which determine defocus parameters from images of untilted specimens, as well as defocus and tilt parameters from image of tilted specimens, respectively, using a simple algorithm.

Type
article
Published
2003-06-01
Cited by
1,521
References
35

Keywords

Tilt (camera), Optics, Visibility, Spectral density, Physics

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