Accurate determination of local defocus and specimen tilt in electron microscopy.
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Summary
Two computer programs are presented, CTFFIND3 and CTFTILT, which determine defocus parameters from images of untilted specimens, as well as defocus and tilt parameters from image of tilted specimens, respectively, using a simple algorithm.
- Type
- article
- Published
- 2003-06-01
- Cited by
- 1,521
- References
- 35
- OpenAlex
- https://openalex.org/W2073949924
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:32629012
Keywords
Tilt (camera), Optics, Visibility, Spectral density, Physics
References
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- Structure of the αβ tubulin dimer by electron crystallography
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- Parameters affecting specimen flatness of two-dimensional crystals for electron crystallography.
- An Apparent Paradox in Crystal Structure Analysis
- Three-dimensional structure of plant light-harvesting complex determined by electron crystallography
- ATP-bound states of GroEL captured by cryo-electron microscopy.
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