Interfacial reactions and growth kinetics for intermetallic compound layer between In–48Sn solder and bare Cu substrate
Explore this paper's citation graph
- Type
- article
- Published
- 2005-01-11
- Cited by
- 133
- References
- 13
- OpenAlex
- https://openalex.org/W1973948523
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:136657561
Keywords
Intermetallic, Soldering, Materials science, Substrate (aquarium), Layer (electronics)
References
- Metallurgy of low temperature Pb-free solders for electronic assembly
- Interfacial reactions in In-Sn/Ni couples and phase equilibria of the In-Sn-Ni system
- GROWTH KINETICS OF INTERMETALLIC COMPOUNDS IN CHIP SCALE PACKAGE SOLDER JOINT
- The Effect of Bi Concentration on Wettability of Cu Substrate by Sn-Bi Solders
- Effects of cooling speed on microstructure and tensile properties of Sn–Ag–Cu alloys
- Characterization of eutectic Sn-Bi solder joints
- Intermetallic compound layer formation between copper and hot-dipped 100In, 50In-50Sn, 100Sn, and 63Sn-37Pb coatings
- Advances in Bonding Technology for Electronic Packaging
- Interfacial microstructure and the kinetics of interfacial reaction in diffusion couples between Sn–Pb solder and Cu/Ni/Pd metallization
- Solder joint reliability of indium-alloy interconnection
- Intermetallic phase formation and shear strength of a Au-In microjoint
- Microstructures developed in solid-liquid reactions: using Cu-Sn reaction, Ni-Bi reaction, and Cu-In reaction as examples
- Progress in the design of new lead-free solder alloys
Cited by
- Reliability study of lead-free solders under specific conditions
- Electromigration in eutectic In-48Sn ball grid array (BGA) solder interconnections with Au/Ni/Cu pads
- The reliability of through silicon via under thermal cycling
- Effect of adding 0.3 wt% Ni into the Sn–0.7 wt%Cu solder: Part I: Wetting behavior on Cu and Ni substrates
- Formation and evolution of intermetallic compounds between the In-3Ag solder and Cu substrate during soldering
- Reliability of In-48Sn solder/Au/Ni/Cu BGA packages during reflow process
- Modeling of interfacial intermetallic compounds in the application of very fine lead-free solder interconnections
- Microstructure and mechanical strength of snag-based solid liquid inter-diffusion bonds for 3 dimensional integrated circuits
- Martensitic Transformation in Sn-Rich SnIn Solder Joints
- The reversible transformation between Cu2(In, Sn) and Cu(In, Sn)2 compounds during solid-state aging
- Electrochemical migration and electrochemical corrosion behaviors in 3wt.% NaCl solution of 64Sn-35Bi-1Ag solder with in doping for micro-nanoelectronic packagings
- Diffusion wave model and growth kinetics of interfacial intermetallic compounds in Sn–3.0Ag–0.5Cu–xTiO2 solder joints
- Phase identification on the intermetallic compound formed between eutectic SnIn solder and single crystalline Cu substrate
- Study on the Solidus Line in Sn-Rich Region of Sn-In Phase Diagram
- Interfacial characteristics of molten Bi-43Sn alloy on amorphous and crystalline Fe78B13Si9
- Joining of Bi-2212 high-Tc superconductors and metals using indium solders
- Microstructure and Growth Behavior of the Intermetallic Compound for Sn-1.0Ag-0.5Cu-NiB/Cu Solder Joint Interface
- Microstructure and impression creep behavior of lead-free Sn–5Sb solder alloy containing Bi and Ag
- Effect of adding 1 wt% Bi into the Sn–2.8Ag–0.5Cu solder alloy on the intermetallic formations with Cu-substrate during soldering and isothermal aging
- Precise Cr-marker investigation on the reactive interface in the eutectic SnIn solder joint
Related papers
- Fabrication and Microstructure of Fe-Al Intermetallic Compound Powders by Mechanical Alloying
- Activation energies of intermetallic compound growth at interface between Sn–5Bi–3.5Ag solder and Cu substrate
- Effect of minor addition of Pb upon interfacial reactions and mechanical properties at Sn-3.0Ag-0.5Cu/Cu and Sn-58Bi/Cu solder joints
- Investigation of intermetallic compounds (IMCs) in electrochemically stripped solder joints with SEM
- 1849 Thermal aging effects on fatigue crack propagation on lead-free solder joints
- Suppression of interfacial intermetallic compounds between Sn–9Zn solder and Cu-substrate by adding Cu-particles in the solder
- Roughness evolution of Cu6Sn5 intermetallic during soldering
- Determination of the rate of formation and of the thickness of the diffusion layer in the system Fe-Al in the temperature range 200–600 °C