An investigation of the beam damage effect on in situ liquid secondary ion mass spectrometry analysis.
Explore this paper's citation graph
Summary
Usable ion yields for both positive and negative characteristic signals (including molecular ions and characteristic fragment ions) were achievable based on optimized experimental conditions for in situ liquid SIMS analysis, and beam damage may not be a concern if proper experimental conditions are used.
- Type
- article
- Published
- 2017-12-15
- Cited by
- 14
- References
- 34
- OpenAlex
- https://openalex.org/W2751608354
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:4377890
Keywords
Chemistry, Secondary ion mass spectrometry, Ion, Analytical Chemistry (journal), Static secondary-ion mass spectrometry
References
- Molecular depth profiling of sucrose films: a comparative study of C60(n+) ions and traditional Cs(+) and O2(+) ions.
- In situ SEM and ToF‐SIMS analysis of IgG conjugated gold nanoparticles at aqueous surfaces
- Mass Spectrometric Imaging of Highly Curved Membranes During Tetrahymena Mating
- Sputtering yields for C60 and Au3 bombardment of water ice as a function of incident kinetic energy.
- SIMS of organics—Advances in 2D and 3D imaging and future outlook
- Probing liquid surfaces under vacuum using SEM and ToF-SIMS.
- The Expanding Role of Electrospray Ionization Mass Spectrometry for Probing Reactive Intermediates in Solution
- Discriminating and imaging different phosphatidylcholine species within phase-separated model membranes by principal component analysis of TOF-secondary ion mass spectrometry images.
- Direct comparison of Au3+ and C60+ cluster projectiles in SIMS molecular depth profiling
- An investigation of secondary ion yield enhancement using Bin2+ (n=1, 3, 5) primary ions
- The Magic of Cluster SIMS
- ToF-SIMS observation for evaluating the interaction between amyloid β and lipid membranes
- Mass spectrometry imaging of mating Tetrahymena show that changes in cell morphology regulate lipid domain formation
- Molecule Specific Imaging of Freeze-Fractured, Frozen-Hydrated Model Membrane Systems Using Mass Spectrometry
- Phosphatidylethanolamine-induced cholesterol domains chemically identified with mass spectrometric imaging.
- Performance of a microfluidic device for in situ ToF-SIMS analysis of selected organic molecules at aqueous surfaces
- Mass spectrometry imaging and profiling of single cells
- Imaging time-of-flight secondary ion mass spectrometry allows visualization and analysis of coexisting phases in Langmuir-Blodgett films
- Making a hybrid microfluidic platform compatible for in situ imaging by vacuum-based techniques
- Cluster primary ion bombardment of organic materials
Cited by
- In-situ discrimination of the water cluster size distribution in aqueous solution by ToF-SIMS
- In Situ Liquid Secondary Ion Mass Spectrometry: A Surprisingly Soft Ionization Process for Investigation of Halide Ion Hydration.
- Dark air–liquid interfacial chemistry of glyoxal and hydrogen peroxide
- Improving in situ liquid SEM imaging of particles
- In situ molecular imaging of adsorbed protein films in water indicating hydrophobicity and hydrophilicity
- In situ liquid SIMS analysis of uranium oxide
- In-situ Electrochemical Testing of Uranium Oxide Alteration under Anoxic Conditions
- Time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy study of 2-phenylimidazole on brass.
- Interfacial Dark Aging Is an Overlooked Source of Aqueous Secondary Organic Aerosol
- The interfacial compatibility between a potential CO2 separation membrane and capture solvents
- Pore confined time-of-flight secondary ion electrochemical mass spectrometry.
- Molecular Imaging Reveals Two Distinct Mixing States of PM2.5 Particles Sampled in a Typical Beijing Winter Pollution Case.
- In Situ Electrochemical Testing of Uranium Dioxide under Anoxic Conditions
- Multi-Dimensional Insights Into the Surface and Interfaces of Battery Materials by Time-of-Flight Secondary Ion Mass Spectrometry.
Related papers
- Investigation of surface layers by SIMS and SIIMS
- Development of ion sources for materials processing in china
- ToF-SIMS analysis of bio-systems: Are polyatomic primary ions the solution?
- Secondary ion mass spectrometry analysis of semiconductor layers
- Secondary ion mass spectrometry : SIMS III : proceedings of the third international conference, Technical University, Budapest, Hungary, August 30-September 5, 1981
- Focused ion beam-secondary ion mass spectrometry analyses of nanostructured thin films
- A new secondary ion mass spectrometry (SIMS) system with high-intensity cluster ion source
- Characterization and removal of ion yield transients in the near surface region of secondary ion mass spectrometry depth profiles