Direct comparison of Au3+ and C60+ cluster projectiles in SIMS molecular depth profiling
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Summary
The sputtering properties of two representative cluster ion beams in secondary ion mass spectrometry (SIMS), C60+ and Au3+, have been directly compared to further optimize the use of cluster projectiles for SIMS molecular depth profiling experiments.
- Type
- article
- Published
- 2007-03-01
- Cited by
- 50
- References
- 26
- Access
- Open access
- OpenAlex
- https://openalex.org/W2009076604
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:12796006
Keywords
Chemistry, Sputtering, Cluster (spacecraft), Projectile, Analytical Chemistry (journal)
References
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- Impact energy dependence of SF5+ ion beam damage of poly(methyl methacrylate) studied by time-of-flight secondary ion mass spectrometry
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- Depth profiling of Langmuir-Blodgett films with a buckminsterfullerene probe.
- The Magic of Cluster SIMS
- Molecular depth profiling of multilayer polymer films using time-of-flight secondary ion mass spectrometry.
- Development and experimental application of a gold liquid metal ion source
- Is proton cationization promoted by polyatomic primary ion bombardment during time-of-flight secondary ion mass spectrometry analysis of frozen aqueous solutions?
- Improvement of biological time-of-flight-secondary ion mass spectrometry imaging with a bismuth cluster ion source
- Molecular depth profiling of histamine in ice using a buckminsterfullerene probe.
- Depth profiling of 4-acetamindophenol-doped poly(lactic acid) films using cluster secondary ion mass spectrometry.
- Proton transfer in time-of-flight secondary ion mass spectrometry studies of frozen-hydrated dipalmitoylphosphatidylcholine.
- Depth profiling of peptide films with TOF-SIMS and a C60 probe.
- Molecular depth profiling with cluster ion beams.
- A Comparison of Desorption Yields from C+60 to Atomic and Polyatomic Projectiles at keV Energies
- Mass spectral analysis and imaging of tissue by ToF-SIMS—The role of buckminsterfullerene, C60+, primary ions
- A C60 primary ion beam system for time of flight secondary ion mass spectrometry: its development and secondary ion yield characteristics.
- Organic ion imaging beyond the limit of static secondary ion mass spectrometry
- Comparison of polyatomic and atomic primary beams for secondary ion mass spectrometry of organics
Cited by
- Mass spectrometry coupled to imaging techniques: the better the view the greater the challenge
- Surface characterization and depth profiling of biological molecules by electrospray droplet impact/SIMS
- Ionization sources and mass analyzers in MS imaging.
- Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy
- Interaction of energetic clusters (Au3, Au400 and C60) with organic material and adsorbed gold nanoparticles
- The chemical composition of animal cells reconstructed from 2D and 3D ToF-SIMS analysis.
- From pixel to voxel: a deeper view of biological tissue by 3D mass spectral imaging
- Surface analysis for compositional, chemical and structural imaging in pharmaceutics with mass spectrometry: a ToF-SIMS perspective.
- Carbon nanotube-fullerene hybrid nanostructures by C₆₀ bombardment: formation and mechanical behavior.
- Mass spectrometry imaging of rat brain sections: nanomolar sensitivity with MALDI versus nanometer resolution by TOF–SIMS
- Fabric analysis by ambient mass spectrometry for explosives and drugs.
- Developments in molecular SIMS depth profiling and 3D imaging of biological systems using polyatomic primary ions.
- Computational view of surface based organic mass spectrometry.
- Landscape for semiconductor analysis: Issues and challenges
- Molecular depth profiling with cluster ion beams.
- Ultra-low-angle microtomy and static secondary ion mass spectrometry for molecular depth profiling of UV-curable acrylate multilayers at the nanoscale
- Enhancing Secondary Ion Yields in Time of Flight-Secondary Ion Mass Spectrometry Using Water Cluster Primary Beams
- Effect of sample rotation on surface roughness with keV C60 bombardment in secondary ion mass spectrometry (SIMS) experiments
- Molecular Dynamics Study on the Generation of Single-Walled Carbon Nanotubes Junction by Direct C60 Bombardment
- MASS SPECTROMETRY IMAGING FOR DRUGS AND METABOLITES
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