Adsorption of tin on the Ge(111)-c(2 × 8) surface studied with scanning tunneling microscopy and photoelectron spectroscopy
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- Type
- article
- Published
- 1995-04-20
- Cited by
- 23
- References
- 16
- OpenAlex
- https://openalex.org/W2063397675
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:97984219
Keywords
Overlayer, Scanning tunneling microscope, Monolayer, X-ray photoelectron spectroscopy, Amorphous solid
References
- Semiconductors and electronic devices
- Adatom and rest-atom contributions in Ge(111)c(2 x 8) and Ge(111)-Sn(7 x 7) core-level spectra.
- Structural study of Sn-induced superstructures on Ge(111) surfaces by RHEED
- Semiconductor surface structures
- Electronic structure of the annealed Ge(111) and Si(111) surfaces: Similarities in local bonding
- X-ray diffraction study of the Ge(111)5 x 5-Sn and Ge(111)7 x 7-Sn surfaces.
- Photoemission spectroscopy at MAX‐Lab
- Core-level study of the phase transition on the Ge(111)-c(2 x 8) surface.
- Structural study of ultrathin Sn layers deposited onto Ge(111) and Si(111) surfaces by RHEED
- Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy
- Epitaxial growth of Sn on Si(111): A direct atomic-structure determination of the (2 sqrt 3 x 2 sqrt 3 )R30 degrees reconstructed surface.
- Interdiffusion at the Ge(100)/Sn and Ge(111)/Sn interfaces
- Structure of Sn/Ge(111) from low-energy electron-diffraction and photoemission studies.
- Structural anomaly of liquid Sn layers adsorbed on Ge(1 1 1) surfaces
- Initial stages of interface formation in group IV-IV systems: Sn ON Ge(100) and Ge(111)
- Adsorption of Sn onSi(111)7 × 7: reconstructions in the monolayer regime
Cited by
- Perturbation of Ge(1 1 1) and Si(1 1 1)√3α-Sn surfaces by adsorption of dopants
- Surface Reconstruction of (123) and (111) Ge(Sn) Solid Solutions Induced by Tin Segregation
- Electron correlation and many‐body effects at interfaces on semiconducting substrates
- Metal-semiconductor fluctuations on reconstructed SnSi(111) surfaces
- Charge rearrangement in the GexPb1−x/Ge(111) interface
- Surface phase transitions at metal–semiconductor interfaces: a revisit is needed
- An STM study of the surface defects of the ( 3 3 ) -Sn/Si(1 1 1) surface
- Adsorption of Sn on the Ge(111)‐(3 × 3) surface studied by ab initio density functional theory
- Kinetics of tin segregation on crystalline semiconductor surfaces: effect of the defects induced by ion bombardment
- Dynamical fluctuation and surface phase transition at the Sn/Ge(111) √3×√3R30°-α interface
- Surface charge density waves at Sn/Ge(111)?
- Defect-blurred two-dimensional phase transition
- Interface states at semiconductor junctions
- The Fermi surface of Sn/Ge(111) and Pb/Ge(111)
- Low Temperature Scanning Tunneling Microscopy and Scanning Tunneling Spectroscopy Study at the α-Sn/Ge(111) Surface
- Electronic instabilities of the two-dimensional Sn/Ge(111) α-phase
- Many-body effects in the electronic structure of Sn/Si(111)-α-(3)1/2
- Influence of charged impurities on the surface phases of Sn/Ge(1 1 1)
- Nature of the √3α to 3 × 3 reversible phase transition at low temperature in Sn/Ge (111)
- Scanning Tunneling Microscopy and Photoelectron Spectroscopy Studies of Si(111) and Ge(111) Surfaces: Clean and Modified by H or Sn Atoms
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