Investigation of the optical and electronic properties of Ge2Sb2Te5 phase change material in its amorphous, cubic, and hexagonal phases
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- Type
- article
- Published
- 2005-04-18
- Cited by
- 396
- References
- 37
- OpenAlex
- https://openalex.org/W2003107482
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:120247256
Keywords
Amorphous solid, Photoconductivity, Materials science, Band gap, Semiconductor
References
- Composition and Properties of Layered Compounds in the GeTe–Sb2Te3System
- Thermoelectric Properties of nGeTe · mSb2Te3Layered Compounds
- Amorphous and liquid semiconductors
- Spectroscopic Ellipsometry and Reflectometry: A User's Guide
- In situ transmission electron microscopy study of the crystallization of Ge2Sb2Te5
- Structural transformations of Ge2Sb2Te5 films studied by electrical resistance measurements
- Survey of Semiconductor Physics: Electrons and Other Particles in Bulk Semiconductors
- High Speed Overwritable Phase Change Optical Disk Material
- Drude-like behavior of Ge:Sb:Te alloys in the infrared
- Optimum Growth Conditions of Ge–Sb–Te Alloy Thin Film Investigated by Ellipsometry
- Spectroscopic Ellipsometry Studies on Optical Constants of Ge2Sb2Te5 Used for Phase Change Optical Disks
- Parameterization of the optical functions of amorphous materials in the interband region
- Interference-Free Determination of the Optical Absorption Coefficient and the Optical Gap of Amorphous Silicon Thin Films
- Thermoelectric power and electrical resistivity of crystalline antimony telluride (Sb2Te3) thin films: Temperature and size effects
- Thermal and electrical properties of the Ge:Sb:Te system by photoacoustic and Hall measurements.
- Optical properties of Ge:Sb:Te ternary alloys
- Structural properties of GeTe at T=0.
- Optical Transition of Chalcogenide Phase-Change Thin Films
- OBTAINING OPTICAL CONSTANTS OF THIN GEXSBYTEZ FILMS FROM MEASUREMENTS OF REFLECTION AND TRANSMISSION
- Thermoelectric properties of Sb 2 Te 3 under pressure and uniaxial stress
Cited by
- Ultrafast interfacial transformation from 2D- to 3D-bonded structures in layered Ge-Sb-Te thin films and heterostructures.
- An electrically driven structural phase transition in single Ag2Te nanowire devices.
- Nonlocal and collective phenomena in the plasmons of metallic nanostructures: With application to ultrasensitive biosensing and nonlinear nano-optics
- Chalcogenide thin film materials for next generation data storage
- Charge transport in phase change materials
- Confined nanoscale chalcogenide phase change material and memory
- Current-Driven Monte Carlo Simulation of Conduction in Switching Chalcogenides
- Ab initio investigation of phase change materials : structural, electronic and kinetic properties
- Investigations of binary and ternary phase change alloys for future memory applications
- Electrical Conductivity Discontinuity at Melt in Phase Change Memory
- Optical properties of (GeTe, Sb2Te3) pseudobinary thin films studied with spectroscopic ellipsometry
- Structural fingerprints of electronic change in the phase-change-material: Ge2Sb2Te5
- Amorphization dynamics of Ge2Sb2T35 films under nano- and femtosecond laser pulse irradiation
- Effects of hydrostatic pressure on the electrical properties of hexagonal Ge2Sb2Te5: Experimental and theoretical approaches
- Dependence of energy band offsets at Ge2Sb2Te5/SiO2 interface on nitrogen concentration
- High-resolution x-ray photoelectron spectroscopy on oxygen-free amorphous Ge2Sb2Te5
- Vibrational properties of hexagonal Ge2Sb2Te5 from first principles
- Direct evidence of phase separation in Ge2Sb2Te5 in phase change memory devices
- Characteristics of amorphous Ag0.1(Ge2Sb2Te5)0.9 thin film and its ultrafast crystallization
- Crystallization of sputtered-deposited and ion implanted amorphous Ge2Sb2Te5 thin films
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