X-ray studies on the structure of p-(Pb1−xSnx)1−y Tey thin films

Siddhartha Das, B. K. Samantaray, S. Bhattacherjee, A. K. Chaudhuri · Journal of Materials Science · 1991

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Type: article
Published: 1991-05-01
Cited by: 4
References: 11
DOI: https://doi.org/10.1007/bf00545541
OpenAlex: https://openalex.org/W1987489283
Semantic Scholar: https://api.semanticscholar.org/CorpusID:93299272

Keywords

Crystallite, Materials science, Mica, Misorientation, Crystallography

References

Preparation and characterization of Pb1−xSnxTe pseudobinary alloy semiconductorsSiddhartha Das, A. K. Chaudhuri, Susmita Bhattacharya — 1981
Study of photoconductive PbTe films by the method of variance analysis of X-ray diffraction profilesNishant Sinha, B K Samantary, A. K. Chaudhuri — 1976
Solid State Surface ScienceMino Green, Julius Klerer — 1970
Line shape analysis of cold-worked magnesiumG. B. Mitra, N.K. Misra — 1967
X-Ray Studies on the Microstructure of Vacuum Evaporated SnTe Thin FilmsS. Santhanam, B. K. Samantaray, A. K. Chaudhuri — 1982
III. Dislocation densities in some annealed and cold-worked metals from measurements on the X-ray debye-scherrer spectrumG.K. Williamson, R.E. Smallman — 1956
Background errors in X-ray diffraction parametersG. B. Mitra, N.K. Misra — 1966
Structural defects in chemically deposited photoconducting films of PbSH. N. Acharya, N.K. Misra — 1971
A note on the line profiles associated with mistakesA. J. C. Wilson — 1958
Determination of particle size and strain in cold‐worked magnesium by the method of varianceN.K. Misra, G. B. Mitra — 1967
Tellurium-rich growth and laser fabrication of lead-tin-telluride (Pb1−xSnxTe: 0.06Wayne Lo — 1977
Mosaic structureP. B. Hirsch — 1956

Cited by

Photoconductivity and Electrical Properties of Pb1 - xSnxTe thin filmsF. S. Terra, Mohamed Abdelrafea, Mohammed El Amine Monir — 2001
Study of layer disorder and microstructural parameters of molybdenumtungsten mixed sulpho-selenide Mo0.5W0.5SxSe2-x (0 ⩽ x ⩽ 2) by X-ray line profile analysisDebashis Palit, S. K. Srivastava, M.C. Chakravorti — 1996
Studies on layer disorder, microstructural parameters and other properties of tantalum substituted tungsten-molybdenum selenide, W0.65Mo0.35−xTaxSe2 (0≤x≤0.35)Debashis Palit, S. K. Srivastava, M.C. Chakravorti — 1997
Electron microscopic studies of vacuum-evaporated (Pb1 −xSnx)1 −yTey thin filmsSandip Das, S. Bhattacherjee, A. K. Chaudhuri — 1993

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