Study of layer disorder and microstructural parameters of molybdenumtungsten mixed sulpho-selenide Mo0.5W0.5SxSe2-x (0 ⩽ x ⩽ 2) by X-ray line profile analysis
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- Type
- article
- Published
- 1996-01-01
- Cited by
- 6
- References
- 14
- OpenAlex
- https://openalex.org/W306586874
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:136975555
Keywords
Materials science, Selenide, Layer (electronics), Line (geometry), Microstructure
References
- Sulphide Catalysts, Their Properties and Applications
- Synthesis and characterization of indium intercalation compounds of tungsten disulphide: InxWS2 (0 ⩽ x ⩽ 1)
- X-ray studies on the structure of p-(Pb1−xSnx)1−y Tey thin films
- Study of layer disorder and other microstructural parameters in InSe thin films
- The Effect of Cold‐Work Distortion on X‐Ray Patterns
- Preparation and x-ray study of mixed-anion tungsten dichalcogenides
- III. Dislocation densities in some annealed and cold-worked metals from measurements on the X-ray debye-scherrer spectrum
- Hole Reactions from d‐Energy Bands of Layer Type Group VI Transition Metal Dichalcogenides: New Perspectives for Electrochemical Solar Energy Conversion
- Layer type tungsten dichalcogenide compounds: their preparation, structure, properties and uses
- Preparation and characterization of molybdenum disulphide catalysts
- Synthesis and characterization of molybdenum-tungsten mixed sulphoselenide, Mo0.5W0.5SxSe2−x (0 ⩽ x ⩽ 2)
- Indium intercalation compounds of molybdenum disulphide; InxMoS2 (0⩽ × ⩽1)
- Structure, properties and morphological studies of indium intercalation compounds of tungsten disulphide, InxWS2 (0 ⩽¡x ⩽ 1)
- Preparation, structure and properties of indium intercalation compounds of tungsten diselenide, InxWSe2 (0≤x≤1)
- Preparation and x-ray study of mixed-anion tungsten dichalcogenides
Cited by
- Structural characterization of indium intercalation compounds of molybdenum sulphoselenide by X-ray diffraction and electron microscopy
- Growth and structural characterizations of chromium mixed molybdenum diselenides (CrxMo1−xSe2 (x=0.25, 0.50, 0.75)) single crystals
- Defect studies by X-ray diffraction, electrical and optical properties of layer type tungsten mixed molybdenum sulphoselenide
- Two solvent grinding sonication method for the synthesis of two-dimensional tungsten disulphide flakes.
- Two-dimensional semiconductors for future optical applications
- Growth, characterization and photoconduction properties of Sb0.1Mo0.9Se2 single crystals grown by DVT technique
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