Study of layer disorder and microstructural parameters of molybdenumtungsten mixed sulpho-selenide Mo0.5W0.5SxSe2-x (0 ⩽ x ⩽ 2) by X-ray line profile analysis

Explore this paper's citation graph

Type
article
Published
1996-01-01
Cited by
6
References
14

Keywords

Materials science, Selenide, Layer (electronics), Line (geometry), Microstructure

References

Cited by

Related papers