A Symbolic Inject-and-Evaluate Paradigm for Byzantine Fault Diagnosis
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Summary
This paper presents an implicit enumeration technique using symbolic simulation for diagnosing faults that exhibit the so-called Byzantine General's phenomenon, in which a fault manifests itself as a non-logical voltage level at the fault site.
- Type
- article
- Published
- 2003-04-01
- Cited by
- 10
- References
- 17
- OpenAlex
- https://openalex.org/W92532996
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:18969946
Keywords
Computer science
References
- The Modern Fault Dictionary
- ErrorTracer: a fault simulation-based approach to design error diagnosis
- SIS : A System for Sequential Circuit Synthesis
- Digital systems testing and testable design
- Modelling the unmodellable: algorithmic fault diagnosis
- Multiple error diagnosis based on Xlists
- Bridge fault diagnosis using stuck-at fault simulation
- On improving the accuracy of multiple defect diagnosis
- A fast algorithm for locating and correcting simple design errors in VLSI digital circuits
- Error Diagnosis for Transistor-Level Verification
- Beyond the byzantine generals: unexpected behavior and bridging fault diagnosis
- On correction of multiple design errors
- Diagnosis and Correction of Logic Design Errors in Digital Circuits
- A technique for logic fault diagnosis of interconnect open defects
- Yield-oriented computer-aided defect diagnosis
- Graph-based Algorithm for Boolean Function Manipulation
Cited by
- Modélisation de défauts paramétriques en vue de tests statiques et dynamiques
- VLSI circuit defect diagnosis: Open defects and run -time speed
- Diagnosing Multiple Byzantine Open-Segment Defects Using Integer Linear Programming
- An ILP-Based Diagnosis Framework for Multiple Open-Segment Defects
- Net diagnosis using stuck-at and transition fault models
- A fading algorithm for sequential fault diagnosis [logic IC testing]
- Clues for Modeling and Diagnosing Open Faults with Considering Adjacent Lines
- Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines
- Test and diagnosis pattern generation for distinguishing stuck-at faults and bridging faults
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