Randomness in Integrated Circuits with Applications in Device Identification and Random Number Generation

Keywords

Randomness, Random number generation, Static random-access memory, Computer science, Identification (biology)

References

• New methodologies of NBTI characterization eliminating recovery effectsM. Denais, V. Huard, C. Parthasarathy — 2004
• IC identification circuit using device mismatchK. Lofstrom, W.R. Daasch, D. Taylor — 2000
• A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic ApplicationsLawrence E Bassham, Andrew L. Rukhin, Juan Soto — 2000
• Design of low-power baseband-processor for RFID tagYan He, Jianyun Hu, Qiang Li — 2006
• Vulnerabilities in First-Generation RFID-enabled Credit CardsThomas S. Heydt-Benjamin, Daniel V. Bailey, Kevin Fu — 2007
• Low temperature data remanence in static RAMSergei Skorobogatov — 2002
• Implications of fundamental threshold voltage variations for high-density SRAM and logic circuitsDavid C. Burnett, Kent Erington, C.K. Subramanian — 1994
• Design of ultra-low-cost UHF RFID tags for supply chain applicationsR. Glidden, C. Bockorick, Sharp Cooper — 2004
• Thermal Agitation of Electricity in ConductorsJ. B. Johnson — 1927
• Extracting Randomness: A Survey and New ConstructionsNoam Nisan, Amnon Ta‐Shma — 1999
• An Analytical Model for Negative Bias Temperature InstabilitySanjay Kumar, Chris H. Kim, Sachin S. Sapatnekar — 2006
• A 0.05×0.05mm2 RFID Chip with Easily Scaled-Down ID-MemoryM. Usami, Hisao Tanabe, Akira Sato — 2007
• White noise in MOS transistors and resistorsRahul Sarpeshkar, Tobi Delbrück, Carver Mead — 1993
• Thermal Agitation of Electric Charge in ConductorsH. Nyquist — 1928
• A subthreshold-CMOS chaotic oscillatorJ.E. Neeley, J.G. Harris — 1996
• The Impact of NBTI on the Performance of Combinational and Sequential CircuitsWenping Wang, Shengqi Yang, Sarvesh Bhardwaj — 2007
• Design of a Low-Power Digital Core for Passive UHF RFID TransponderAndrea Ricci, M. Grisanti, Ilaria De Munari — 2006
• Intrinsic MOSFET parameter fluctuations due to random dopant placementXinghai Tang, Vivek De, J.D. Meindl — 1997
• Secure deletion of data from magnetic and solid-state memoryPeter Gutmann — 1996
• Matching properties of MOS transistorsMarcel Pelgrom, Aad C.J. Duinmaijer, A.P.G. Welbers — 1988

Cited by

• Analysis of Microcontroller Embedded SRAMs for Applications in Physical Unclonable FunctionsSakib Imtiaz — 2016

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