Power-Up SRAM State as an Identifying Fingerprint and Source of True Random Numbers
Explore this paper's citation graph
- Type
- article
- Published
- 2009-09-01
- Cited by
- 836
- References
- 59
- OpenAlex
- https://openalex.org/W2113322447
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:60072
Keywords
Static random-access memory, Computer science, Random number generation, Byte, Randomness
References
- Nonvolatile semiconductor memory technology : a comprehensive guide to understanding and to using NVSM devices
- IC identification circuit using device mismatch
- A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications
- A predictive reliability model for PMOS bias temperature degradation
- Vulnerabilities in First-Generation RFID-enabled Credit Cards
- We Can Remember It for You Wholesale: Implications of Data Remanence on the Use of RAM for True Random Number Generation on RFID Tags (RFIDSec 2009)
- Thermal Agitation of Electricity in Conductors
- Extracting Randomness: A Survey and New Constructions
- Static-noise margin analysis of MOS SRAM cells
- Thermal Agitation of Electric Charge in Conductors
- Interface trap generation and hole trapping under NBTI and PBTI in advanced CMOS technology with a 2-nm gate oxide
- Universal Classes of Hash Functions
- MOS device modeling at 77 K
- SRAM leakage suppression by minimizing standby supply voltage
- Intrinsic MOSFET parameter fluctuations due to random dopant placement
- 16.7 fA/cell tunnel-leakage-suppressed 16 Mb SRAM for handling cosmic-ray-induced multi-errors
- Physical Unclonable Functions and Public-Key Crypto for FPGA IP Protection
- Design of a Passively-Powered, Programmable Sensing Platform for UHF RFID Systems
- A Low Cost Solution to Authentication in Passive RFID Systems
- Statistical analysis of SRAM cell stability
Cited by
- MANAGING AND LEVERAGING VARIATIONS AND NOISE IN NANOMETER CMOS
- TARDIS: Time and Remanence Decay in SRAM to Implement Secure Protocols on Embedded Devices without Clocks
- On-Chip True Random Number Generation in Nanometer Cmos
- Reliable, Secure, Efficient Physical Unclonable Functions
- True random number generation based on environmental noise measurements for military applications
- Synergistic Configurable Ring Oscillator PUF: Design, Characterization, and Implementation
- Security and privacy in RFID systems. (Sécurité et protection de la vie privée dans les systèmes RFID)
- Secure and Energy Efficient Physical Unclonable Functions
- Schmitt-Trigger-based Recycling Sensor and Robust and High-Quality PUFs for Counterfeit IC Detection
- IC Piracy Protection by APUF and Logic Obfuscation
- Modulated Backscatter for Low-Power High-Bandwidth Communication
- Losowość generatora łączonego TRNG wykorzystujacego metodę z próbkowaniem wyjścia generatora pierścieniowego
- Uniquely Identifiable Tamper-Evident Device Using Coupling between Subwavelength Gratings
- Modelling and characterization of physically unclonable functions
- Hardware Design Techniques for Securing and Synthesizing Resource-Constrained IoT Systems
- Adaptive Generation of Unique IDs for Digital Chips through Analog Excitation
- Radio Frequency Identification. Security and Privacy Issues - 11th International Workshop, RFIDsec 2015, New York, NY, USA, June 23-24, 2015, Revised Selected Papers
- Low cost and energy, thermal noise driven, probability modulated random number generator
- Robust unclonable identifiers and true random numbers from off-the-shelf SRAMs
- Wireless firmware execution control in computational RFID systems
Related papers
- Evaluation of National Institute of Standards and Technology (NIST) Thermal Conductivity Standard Reference Materials Using a 20-cm Heat Flow Meter Apparatus
- Technique for assessing PNA measurement repeatability using a NIST standard
- Primary Atomic Frequency Standards at NIST
- Assessing the Impact of the National Institute of Standards and Technology’s Research Collaborations
- Replicating UTC(NIST) at Remote Sites
- Speaker Diarization and Localization Technology Research Based on NIST Evaluation: Speaker Diarization and Localization Technology Research Based on NIST Evaluation
- Experimental study of NIST Statistical Test Suite ability to detect long repetitions in binary sequences
- Aging-Resilient SRAM-based True Random Number Generator for Lightweight Devices
- SRAM Circuits for True Random Number Generation Using Intrinsic Bit Instability