Multiscale Characterization of Additive Manufacturing Components with Computed Tomography, 3D X-ray Microscopy, and Deep Learning

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Summary

A significant leap forward is demonstrated in AM characterization by integrating advanced XCT, XRM, and DL techniques, offering valuable insights into the relationships between processing parameters, microstructure, and part performance, and driving innovations that enhance the quality and reliability of AM products for demanding industrial applications.

Type
article
Published
2025-08-18
Cited by
8
References
52
Access
Open access

Keywords

Characterization (materials science), Solid mechanics, Materials science, Tomography, Microscopy

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