Degradation of metallic materials studied by correlative tomography

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Summary

This work focuses on the linking of time lapse X-ray computed tomography (CT) and serial section electron tomography using the focussed ion beam (FIB)-scanning electron microscope to study the degradation of metals.

Type
article
Published
2017-08-01
Cited by
10
References
41
Access
Open access

Keywords

Microscale chemistry, Correlative, Characterization (materials science), Tomography, Electron tomography

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