COMPARISON OF BACK-SCATTERING PROPERTIES OF ELECTRON EMISSION MATERIALS

Z. Insepov, В. А. Иванов, S. J. Jokela, M. Wetstein · Nazarbayev University Repository (Nazarbayev University) · 2011

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Type: article
Published: 2011-01-01
Cited by: 3
References: 11
Access: Open access
OpenAlex: https://openalex.org/W2181516016
Semantic Scholar: https://api.semanticscholar.org/CorpusID:54584719

Keywords

Electron, Monte Carlo method, Scattering, Secondary electrons, Computational physics

References

Monte Carlo Modeling for Electron Microscopy and MicroanalysisDavid C. Joy — 1995
Monte Carlo calculations of low energy electron backscatter coefficientsArian L. Pregenzer — 1985
CASINO: A new monte carlo code in C language for electron beam interaction —part I: Description of the programPierre Hovington, Dominique Drouin, Raynald Gauvin — 2006
Advances in the photodetection technologies for Cherenkov imaging applicationsE. Nappi — 2009
Secondary electron emission in the scanning electron microscopeDavid Moncrieff, P.R. Barker — 1978
Test of the new hybrid INTEVAC intensified photocell for the use in air Cherenkov telescopesStella Bradbury, R. Mirzoyan, J. Gebauer — 1997
A model for calculating secondary and backscattered electron yieldsDavid C. Joy — 1987
Secondary Electron EmissionA. Dekker — 1981
Secondary electron emission of MgO filmsA. Gogh — 1995

Cited by

Timing characteristics of Large Area Picosecond PhotodetectorsBernhard W. Adams, A. Elagin, Henry J. Frisch — 2015
Secondary Electron Yield of Emissive Materials for Large-Area Micro-Channel Plate Detectors: Surface Composition and Film Thickness DependenciesS. J. Jokela, I. V. Veryovkin, A. V. Zinovev — 2012
Mechanisms of sustaining a radio-frequency atmospheric pressure planar dischargeLei Wang, Gheorghe Dinescu, Xiaolong Deng — 2017

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