The effects of microcrystal size and shape on the one phonon Raman spectra of crystalline semiconductors
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- Type
- article
- Published
- 1986-06-01
- Cited by
- 1,988
- References
- 8
- OpenAlex
- https://openalex.org/W2051307234
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:98554683
Keywords
Raman spectroscopy, Raman scattering, Phonon, Condensed matter physics, Asymmetry
References
- Raman scattering from hydrogenated microcrystalline and amorphous silicon
- Stress-Induced Shifts of First-Order Raman Frequencies of Diamond- and Zinc-Blende-Type Semiconductors
- The one phonon Raman spectrum in microcrystalline silicon
- Raman scattering from gas-evaporated silicon small particles
- The Raman microprobe: A quantitative analytical tool to characterize laser-processed semiconductors
- Effect of dimensions on the vibrational frequencies of thin slabs of silicon
- Effects of As+ ion implantation on the Raman spectra of GaAs: ‘‘Spatial correlation’’ interpretation
- Raman Characterization Of Semiconductors Revisited
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- Characterization and manipulation of ion beam synthesized germanium nanocrystals
- The effect of Ge implantation dose on the optical properties of Ge nanocrystals in SiO2
- Nouvelles morphologies du silicium nanostructuré issues de l'anodisation électrochimiques : élaboration, propriétés physico-chimiques et applications
- Surface energy engineering for tunable wettability through controlled synthesis of MoS2.
- Studies of silicon nanoparticles uptake and biodegradation in cancer cells by Raman spectroscopy.
- Size-Dependent Raman Shifts for nanocrystals
- Optical Properties of GaSb Nanofibers
- Deconvoluting Diffuse Reflectance Spectra for Retrieving Nanostructures' Size Details: An Easy and Efficient Approach.
- Study of Anatase to Rutile Phase Transition in Nanocrystalline Titania Films
- Modélisation de l'effet tunnel à un électron dans les dispositifs à nanocristaux semiconducteurs : effet tunnel à un électron assisté par phonon
- Raman investigation of CdxZn1−xSe/ZnSe quantum wires: Strain relaxation and excitation profile
- Raman characterization of CdTe nanocrystallites embedded in a glass matrix
- Spectroscopie et imagerie Raman de matériaux inhomogènes
- Characterization of La-Doped TiO2Nanopowders by Raman Spectroscopy
- Raman Light Scattering in System of Oriented Wires in Porous Silicon
- Structural Characteristics of p-Type Porous Silicon and their Relation to the Nucleation and Growth of Pores
- Structural variations in polysilicon, associated with deposition temperature and degree of anneal
- Silicon nanowires prepared by metal induced etching (MIE): good field emitters
- One and two-phonon Raman scattering from nanostructured silicon
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