Compactness evaluation of amorphous and nanocrystaline thin films by FT-IR reflection-absorption spectroscopy
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- Type
- article
- Published
- 2004-10-15
- Cited by
- 0
- References
- 9
- OpenAlex
- https://openalex.org/W2032097160
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:137340314
Keywords
Amorphous solid, Materials science, Wafer, Thin film, Spectroscopy
References
- Handbook of chemistry and physics
- Optical Properties of Some Metal Oxides in Solar Absorbers
- Fourier transform infrared spectra and normal vibrations of CuO
- Infrared Absorption at Longitudinal Optic Frequency in Cubic Crystal Films
- Structural and optical characterization of CuO particulate solid films and the corresponding gels and xerogels
- Optical properties of thin films and the Berreman effect
- Kramers-Kronig Calculation of the Grazing Angle Reflection Spectrum of Barrier Oxide Layer on Aluminum
- Conventional and unconventional infrared spectrometry and their quantitative interpretation
- Surface infrared and Raman spectroscopy
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