SHORT TIME CORRELATIONS IN A TWO-DIMENSIONAL ISING MODEL WITH A LINE OF DEFECTS
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- Type
- article
- Published
- 2001-10-30
- Cited by
- 2
- References
- 7
- OpenAlex
- https://openalex.org/W2009486972
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:120377008
Keywords
Ising model, Statistical physics, Monte Carlo method, Exponent, Physics
References
- Remanent magnetization decay at the spin-glass critical point: A new dynamic critical exponent for nonequilibrium autocorrelations.
- VOLTAGE-CONTROLLED SHARP-LINE ELECTROLUMINESCENCE IN GAAS-ALAS DOUBLE-BARRIER RESONANT-TUNNELING STRUCTURES
- Generalized Dynamic Scaling for Critical Relaxations.
- The short-time dynamics of the critical Potts model
- New universal short-time scaling behaviour of critical relaxation processes
- Dynamic Monte Carlo Measurement of Critical Exponents.
- Universality and scaling in short-time critical dynamics
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