Atomic force microscopy measurements of crystal nucleation and growth rates in thin films of amorphous Te alloys

Keywords

Nucleation, Amorphous solid, Materials science, Crystallization, Thin film

References

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Cited by

• Three-dimensional measurement of atomic force microscope cantilever deformation to determine the three-dimensional applied force vectorLee Kumanchik — 2010
• Measurement of crystal growth velocity in a melt-quenched phase-change materialHữu Nghĩa Nguyễn — 2013
• Characterization of Metal-Insulator-Transition (MIT) Phase Change Materials (PCM) for Reconfigurable Components, Circuits, and SystemsBrent L. Danner — 2013
• Reliability analysis of embedded Phase-Change Memories based on innovative materialsG. Navarro — 2013
• Phase change materials for non-volatile electronic memoriesMartin Salinga, Matthias Wuttig — 2008
• Ab initio investigation of phase change materials : structural, electronic and kinetic propertiesWei Zhang, Riccardo Mazzarello — 2014
• Physical principles and current status of emerging non-volatile solid state memoriesLei Wang, Cihui Yang, Jing Wen — 2015
• Study on the crystallization by an electrical resistance measurement in Ge2Sb2Te5 and N-doped Ge2Sb2Te5 filmsDi Hu, Xiaomei Lu, Jinsong Zhu — 2007
• Crystallization of ion amorphized Ge2Sb2Te5 thin films in presence of cubic or hexagonal phaseR. De Bastiani, E. Carria, S. Gibilisco — 2010
• Surface energy and the equilibrium shape of hexagonal structured Ge2Sb2Te5 grainYu Jin Park, Jeong Yong Lee, Yong Tae Kim — 2006
• STUDY OF CRYSTALLIZATION IN Ge2Sb2Te5Di Hu, Ruichen Xue, Jianchang Zhu — 2008
• Scanning electron microscope for in situ study of crystallization of Ge2Sb2Te5 in phase-change memory.You Yin, Daisuke Niida, Kazuhiro Ota — 2007
• Phase change mechanisms in Ge2Sb2Te5S. Privitera, S. Lombardo, Corrado Bongiorno — 2007
• Crystalline phases in the GeSb2Te4 alloy system: Phase transitions and elastic propertiesTomasz Błachowicz, M.G. Beghi, G. Güntherodt — 2007
• Scanning tunneling microscopy and spectroscopy of the phase change alloy Ge1Sb2Te4Dinesh Subramaniam, C. Pauly, Marcus Liebmann — 2009
• Crystallization behavior of amorphous Alx(Ge2Sb2Te5)1−x thin filmsJae-Hee Seo, Ki-Ho Song, Hyun‐Yong Lee — 2010
• The Route for Ultra-High Recording Density Using Probe-Based Data Storage DeviceLei Wang, Jing Wen, Cihui Yang — 2015
• Statistics of crystallization kinetics in nanoscale systemsYongwoo Kwon, Dae-Hwan Kang — 2014
• Local Crystal Structures of Ge2Sb2Te5 Revealed by the Atomic Pair Distribution Function AnalysisShin‐ichi Shamoto, Katsuaki Kodama, Satoshi Iikubo — 2006
• Characterization of Ge2Sb2Te5 thin film alloys using conductive‐tip atomic force microscopyChia Min Chang, Yen Ju Liu, Ming Lun Tseng — 2012

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