Separation of hot-electron and self-heating effects in two-dimensional AlGaN/GaN-based conducting channels
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- Type
- article
- Published
- 2003-01-28
- Cited by
- 56
- References
- 12
- Access
- Open access
- OpenAlex
- https://openalex.org/W1964417773
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:119886522
Keywords
Joule heating, Materials science, Heterojunction, Electric field, Sapphire
References
- Introduction to partial differential equations and boundary value problems
- Thermal conductivity of κ-Al2O3 and α-Al2O3 wear-resistant coatings
- Theoretical study of the two-dimensional electron mobility in strained III-nitride heterostructures
- An AlGaN/GaN high-electron-mobility transistor with an AlN sub-buffer layer
- Hot electrons in group-III nitrides at moderate electric fields
- GAN : PROCESSING, DEFECTS, AND DEVICES
- Coupled surface and channel transport in semiconductor heterostructures
- Self-heating in high-power AlGaN-GaN HFETs
- Measurement of temperature in active high-power AlGaN/GaN HFETs using Raman spectroscopy
- Two dimensional electron gases induced by spontaneous and piezoelectric polarization in undoped and doped AlGaN/GaN heterostructures
- The Art of Electronics
- Mathematics in Science and Engineering
Cited by
- Numerical study of electro-thermal effects in silicon devices
- Design and development of radiation-resistant and low-noise semiconductor transistors for applications in high frequency communication systems
- Highly sensitive micro-Hall devices based on Al0.12In0.88Sb∕InSb heterostructures
- Decay of zone-center phonons in GaN with A1, E1, and E2 symmetries
- The Electric Field and Temperature Dependence of Conductance of Two-Dimensional Electron Gas in AlGaN/AlN/GaN
- Noise spectroscopy of AlGaN/GaN HEMT structures with long channels
- QUASI-BALLISTIC AND OVERSHOOT TRANSPORT IN GROUP III-NITRIDES
- Degradation Mechanisms for GaN and GaAs High Speed Transistors
- Terahertz generation in submicron GaN diodes within the limited space-charge accumulation regime
- ELECTRIC FIELD STRENGTH AND TEMPERATURE DEPENDENCE OF CONDUCTION RELAXATION IN AlGaN/AlN/GaN 2D ELECTRON GAS
- Electron transport in bulk GaN under ultrashort high-electric field transient
- TRANSPORT AND NOISE FEATURES IN AlGaN/GaN FIELD EFFECT TRANSISTOR WITH NANOMETER-SCALING GATE LENGTH
- Equilibrium and non-equilibrium 1/f noise in AlGaN/GaN TLM structures
- Hot-electron transport in AlGaN/GaN two-dimensional conducting channels
- Origin of noise in AlGaN/GaN heterostructures in the range of 10-100 MHz
- Doped-channel micro-Hall devices: Size and geometry effects
- AlGaN/GaN heterostructure field-effect transistors with multi-MgxNy/GaN buffer and Photo-CVD SiO2 gate dielectric
- Low-Noise Microwave Devices: AlGaN/GaN High Electron Mobility Transistors and Oscillators
- Trapping effect evaluation of gateless AlGaN/GaN heterojunction field-effect transistors using transmission-line-model method
- Comparative analysis of hot‐electron transport in AlGaN/GaN and AlGaN/AlN/GaN 2DEG channels
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