Large Margin Metric Learning for Multi-Label Prediction

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Summary

This work presents a novel large margin metric learning paradigm for multi-label prediction that learns a distance metric to discover label dependency such that instances with very different multiple labels will be moved far away.

Type
article
Published
2015-01-25
Cited by
90
References
35
Access
Open access

Keywords

Margin (machine learning), Metric (unit), Computer science, Decoding methods, Dependency (UML)

References

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