Synthetic Infrared Data For Target Identification Training and Testing

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Summary

The performance of infrared (IR) target identification classifiers, trained on randomly selected subsets of target chips taken from larger databases of either synthetic or measured data, is shown to improve rapidly with increasing subset size and it is shown that subset of data selected with advanced knowledge can significantly outperform randomly selected sets.

Type
article
Published
2002-08-01
Cited by
1
References
6

Keywords

Classifier (UML), Training set, Computer science, Artificial intelligence, Pattern recognition (psychology)

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