Etude par microscopie à force atomique en mode non contact et microscopie à sonde de Kelvin, de matériaux modèles pour le photovoltaïque organique
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- 2011-11-04
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- 239
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- https://api.semanticscholar.org/CorpusID:264602036
References
- Kelvin force microscopy at the second cantilever resonance: an out-of-vacuum crosstalk compensation setup.
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- Synthesis of conjugated polymers for organic solar cell applications.
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- Toward Self-Organization and Complex Matter
- ESCA : atomic, molecular and solid state structure studied by means of electron spectroscopy
- Organic photovoltaics : concepts and realization
- Impact of electron and scanning probe microscopy on materials research
- Atom-Resolved Imaging of the Potential Distribution at Si (111) 7×7 Surfaces
- Practical surface analysis: By auger and x-ray photoelectron spectroscopy
- Forces in scanning probe methods
- Forces at the nanoscale : interactions in atomic force microscopy and dielectrophoresis
- Organic solar cells with carbon nanotubes replacing In2O3:Sn as the transparent electrode
- Principles of ultraviolet photoelectron spectroscopy
- Building scientific apparatus : a practical guide to design and construction
- Laminated fabrication of polymeric photovoltaic diodes
- KPFM imaging of Si(1 1 1)-Sb surface for atom distinction using NC-AFM
- Self-oscillating mode for frequency modulation noncontact atomic force microscopy
- Nanoscale control of the network morphology of high efficiency polymer fullerene solar cells by the use of high material concentration in the liquid phase
- CuGaSe2 solar cell cross section studied by Kelvin probe force microscopy in ultrahigh vacuum
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