Transmission scanning electron microscopy: Defect observations and image simulations.

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Summary

Interference effects associated with conventional TEM, such as thickness fringes and bending contours are significantly reduced in TSEM by using a convergent probe, similar to a STEM imaging modality, enabling individual defects to be imaged clearly even in high dislocation density regions.

Type
article
Published
2018-03-01
Cited by
48
References
43

Keywords

Physics

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