Phase transition related barrier height in Ga-Si Schottky diode
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- Type
- article
- Published
- 1997-09-01
- Cited by
- 4
- References
- 9
- Access
- Open access
- OpenAlex
- https://openalex.org/W18531015
- Semantic Scholar
- https://api.semanticscholar.org/CorpusID:135216658
Keywords
Materials science, Mineralogy, Chemistry
References
- Epitaxial metal-semiconductor interfaces
- The dependence of Schottky barrier potential on substrate orientation in PtSi infrared diodes
- Structure changes in gallium near its melting point
- A modified forward I‐V plot for Schottky diodes with high series resistance
- Constitution of Binary Alloys
- The physics of semiconductor devices
- Metal–Semiconductor Contacts
- Ion beam synthesis of epitaxial silicides: fabrication, characterization and applications
- On the physics of metal-semiconductor interfaces
- Formation of Ultrathin Single-Crystal Silicide Films on Si: Surface and Interfacial Stabilization of Si-NiSi2Epitaxial Structures
Cited by
- (7×7) reconstruction as barrier for Schottky-barrier formation at the Ga/Si(111) interface
- Stability and phase transition studies of Ga–pWSe2 Schottky diode by current–voltage–temperature method
- The evaluation of the current–voltage and capacitance–voltage-frequency measurements of Yb/p-Si Schottky diodes with a high zero-bias barrier height
- The response of high barrier Schottky diodes to light illumination
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